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        1. 低溫掃描探針顯微鏡 LT-SPM
          閱讀數: 3019

          低溫掃描探針顯微鏡 LT-SPM

          LT-SPM 低溫掃描探針顯微鏡
          上海伯東代理英國 NanoMagnetics LT-SPM 低溫掃描探針顯微鏡, 掃描探針顯微鏡在低溫下的應用比在環境或高溫下的應用更為廣泛.
          LT-SPM 低溫掃描探針顯微鏡優勢:
          減少熱漂移: 低溫作業為消除與熱漂有關的影響提供了最直接和可靠的途徑
          低噪音水平: 將溫度從300k降低到10k, 可以使熱頻率噪聲降低5倍以上, 例如, 可以在石墨等低波紋表面以原子分辨率獲得三維力場
          提高了尖端和樣品的穩定性
          減少壓電滯后/蠕變
          許多物理效應僅限于低溫

          LT-SPM 低溫掃描探針顯微鏡系統參數:
          Imaging Modes         : SHPM, STM, AFM, MFM, EFM, SNOM (in development)
          Scan Size  Head        :  Large Area Scan Head       Standart Scan Head        Small Area Scan
                                                150 x 150 μm @ 300 K        52 x 52 μm @ 300K        8 x 8 μm @ 300 K
                                                36 x 36 μm @ 77 K              14 x 14 μm @ 77 K         3.5 x 3.5 μm @ 77 K
                                                18 x 18 μm @ 4.2 K              6 x 6 μm @ 4.2 K            1.5 x 1.5 μm @ 4.2 K
          Z Range                     : 7.0 μm @ 300 K                  4.8 μm @ 300 K               2.4 μm @ 300 K
                                               1.8 μm @ 77 K                      1.2 μm @ 77 K                 0.6 μm @77K
                                                0.8 μm @ 4.2 K                     0.5 μm @ 4.2 K               0.25 μm @ 4.2K
          Head Dimensions     : 23.6 mm OD x 125 mm  or  25.4 mm OD x 100 mm
          Sample Approach     : Stick-slip type; 10 mm Z, Ø3 mm XY range with 50 - 800 nm step size
          Sample Size              : 15 x 15 x 5 mm maximum
          Temperature Range : 1.0 K - 300 K (Limited by the cryogenic equipment)
          Magnetic Field         : >16 T
           

          NanoMagnetics

          STM Image of
          Gold on Mica, 77 K

                  Vortices in BSCCO, 77 K

              AFM (Phase) Image of
            Calibration Grating, 4.2 K

                  SHPM Image of
                 NIST Calibration Sample, 77 K

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